Active Silicon appoints new General Manager
The company has appointed Brian O'Connell as its new general manager.
Smartkameras
Anis Hanna becomes president on the 25th anniversary
Pleora Technologies has appointed Anis Hanna as president
Efficient quality control through VDI/VDE/VDMA 2632 guidelines
The series of guidelines is intended to become a common technical basis for providers and users of machine vision projects.
Eckelmann with new management in China
Stefan Becker has been appointed Managing Director of Eckelmann Automation Technology in Shanghai and now forms a dual leadership team together with Zhongwei Huang.
Productivity Boost for the Frontline
Machine Vision and AMRs as Part of AI-Driven Strategies in Manufacturing and Warehouse Operations
A New Approach to Fan Inspection
Reliable Quality Control during the Production of Fans for Diesel Engines
Simplified Integration
Intelligent Lens Systems for Remote and Mobile Applications
MWIR system camera for continuous industrial operation
Entry into infrared imaging
Sensor Fusion in Outdoor Applications
AI-Driven Collision Warning System for Mobile Machinery
Time of Flight Method Ensures Depth Perception
Shape Recognition, Object Positioning, and Distance Measurements in Logistics
Measurement uncertainty in manufacturing: Understanding the basics
Why precise measurement results alone are not enough
Optical Metrology Technology: Focus-Variation and its Advanced Extensions
Basics of Measurement Technology
Targeted Grasping of the Right Object
2D Images Combined with Deep Learning Enable Robust Detection Rates
inspect America July 2025 is now available!
In this issue, we provide a comprehensive review of Automate, highlighting the most cutting-edge trends, products, and market insights.
Hexagon plans spin-off
Hexagon plans to spin off its Asset Lifecycle Intelligence and Safety, Infrastructure & Geospatial divisions into a new company called Octave.
Growth in machine vision thanks to AI software
The global machine vision market recorded revenues of $5.6 billion in 2024, representing a decline of 3.9% compared to 2023.
Edmund Optics promotes biophotonics talent
The company was the exclusive industry partner of the 12th International Graduate Summer School on Biophotonics, which took place from June 7 to 14, 2025, on the Swedish island of Ven.
Hyperspectral Imaging for Surface and Layer Analysis
Optical Wafer Inspection
In-line CT Delivers Real-time Quality Feedback at BMW Facility
Computed Tomography and AI Combined
Only the changes count
Event-based cameras optimise flow analysis in science and industry
More Efficient Processes with Multi-Strobe Imaging
Fast lighting control in complex applications
Making Machine Vision Both Easy and Flexible
Compact Camera System Bridges Gap to Smart Cameras
Real-Time AI for Egg Quality Inspection with 21 Cameras
Multi-Camera Vision Systems with 10GigE
Perfect Baked Goods in Record Time
3D Laser Scanner Checks 100,000 Rolls Per Hour
Innovative 3D hand modeling wins award
Dr. Rolandos Alexandros Potamias received the EMVA Young Professional Award 2025 for his work on high-precision 3D hand modeling, recognition, and reconstruction in world coordinates.
Highlights of the EMVA Business Conference 2025 in Rome
The conference will begin with a keynote speech by Marcelo Carvalho on “European Business Outlook – Navigating the New Reality.”
“With ToF, we can solve projects much more easily and at a lower cost”
Interview with Norbert Matthes, Technical Sales Manager
Affordable 3D sensor with a wide field of vision
Laser triangulation sensor with a broad field of vision
“This will be our largest Automate show ever”
Interview with Jeff Burnstein, president of the Association for Advancing Automation (A3)
Image sensor technology with new technology
Imec spin-off Eyeo receives €15 million in start-up capital
Smartphone photo sensors works as antimatter camera
A new device can pinpoint antiproton annihilations with a high resolution, 35-fold better than previous real-time methods.
Quality Control of Electronic Circuit Boards
AI-Powered Optical Inspection Identifies Nanoscale PCB Defects
At the Heart of the Image Acquisition Process
Event Logging System for Application Development and Debugging
Cognex Corporation
Vision On Line GmbH
Balluff GmbH
TKH Group NV
Octum GmbH
IDS Imaging Development Systems GmbH
Ametek GmbH - Division Creaform Deutschland
Balluff MV GmbH
Ametek Germany GmbH
Contrinex Sensor GmbH
Carl Zeiss GOM Metrology GmbH
Pepperl+Fuchs SE
Bergische Universität Wuppertal
Zebra Technologies Corp.
Framos GmbH
Vision Markets GmbH
EVK DI Kerschhaggl GmbH
Edmund Optics Europe
Eckelmann AG
Teledyne DALSA GmbH
Basler AG
E2V Technologies
Texas Instruments Dt. GmbH
Teledyne Technologies Inc.
imec
Institut national de la recherche scientifique (INRS)
EMVA European Machine Vision Association
VMT Vision Machine Technic Bildverarbeitungssyssteme GmbH
phil-vision GmbH
Cognex Germany Inc.
HD Vision Systems GmbH
Isra Vision GmbH
Opto GmbH
InfraTec GmbH Infrarotsensorik und Messtechnik
Kappa optronics GmbH
Teledyne Imaging Group
Emergent Vision Technologies
Laser Components Germany GmbH
Tour Saint-Gobain
SVS-Vistek GmbH
Landesmesse Stuttgart GmbH
Wiley-VCH GmbH
VDI/VDE- Gesellschaft Mess- und Automatisierungstechnik
Lucid Vision Labs, Inc.
Bruker Optik GmbH
University of Tennessee
ifm electronic gmbh
Fisba Optik AG
SPECIM, Spectral Imaging Ltd.
Theia Technologies