Webinar: How to maximize the yield in wafer production
The webinar will take place on June 5 and will be offered at two different times so that interested parties from the Americas, Europe and Asia can participate.
Organized by MVTec, the webinar highlights how machine vision improves wafer inspection and increases quality and throughput in semiconductor manufacturing. Challenges in wafer inspection, such as reflective surfaces and microdefects, are overcome by automated, robust optical inspection processes.
Coco Rogers, Application Engineer in Customer Service with extensive expertise in defect detection and in-depth knowledge of the semiconductor industry, will give a live demonstration of optical inspection processes using advanced technologies. MVTec Halcon's technologies, such as shape-based matching and variation models, will be highlighted to maximize yield.
Markus Setzer, a marketing specialist at MVTec for six years, will moderate the webinar. It is aimed at engineers, technical managers, project managers, and decision-makers who are exploring automation solutions or want to deepen their knowledge, and offers practical insights and solutions instead of theoretical presentations.
The webinar will be offered at two different times:
Date: June 5, 2025
Time for Europe and Asia: 9:00 AM - 9:30 AM CEST
Time for USA and Canada: 11:00 AM - 11:30 AM PMT
