Spectro Analytical Instruments appoints Michael Privik as Managing Director with effect from January 1, 2022. He succeeds Dr. Christoph Mätzig, who has taken over the management of the "Ultra Precision Technologies" division within the Ametek Group.
Peak Metrology, solution provider for the surface metrology sector, is now cooperating with IDC Microinspection. The partnership combines Peak Metrology's instrument and hardware capabilities with IDC MicroInspection's process knowledge and application software. As a result, users of digital microscopes benefit from new possibilities such as larger measurement volumes and greater automation in image acquisition.
Luc Despineux joined the sales team of measurement technology manufacturer Pixargus on October 1, 2021. He is to strengthen international sales in particular.
Guideline VDI/VDE 3511 Sheet 4 "Technische Temperaturmessung - Strahlungsthermometrie" (Technical Temperature Measurement - Radiation Thermometry) has been fundamentally revised and updated on the basis of the December 2011 version. It covers radiation thermometry comprehensively and introduces the basics without presupposing in-depth knowledge of optics or radiation thermometry.
The Fraunhofer Vision division is continuing the series of seminars on optical 3D metrology and is holding the seminar with an practical part “Optical 3D metrology for quality assurance in production” on Wednesday and Thursday, November 10th and 11th, 2021. The venue is the Fraunhofer Development Center for X-ray Technology EZRT in Fürth.
Aerotech, manufacturer of motion control and positioning systems, has established a new subsidiary, Peak Metrology. The aim is to bundle all activities relating to high-precision metrology.
Instrument Systems has been accredited for tests in the field of lighting technology to DIN EN ISO / IEC 17025 since 2009 and is now offering accredited testing of radiant flux and luminous flux with the “Goniospectroradiometry of optical radiation sources” procedure. This procedure has enabled the development of UVC-LED reference sources with traceable reference values of maximum precision for radiant flux and irradiance. These reference sources are used for monitoring and calibrating UV measuring equipment, e.g. the ISP-PTFE series.
Sensor + Test planned as a purely digital event in 2021
Zeiss has acquired GOM, a provider of hardware and software for automated 3D coordinate metrology, the industrial metrology and quality assurance portfolio of its Industrial Quality & Research division.
