Optical Profilometer Lext OLS5500 3D

The new Lext OLS5500 hybrid 3D optical profilometer unites Laser Scanning Microscopy (LSM), White Light Interferometry (WLI), and Focus Variation Microscopy (FVM) in one easy-to-use platform for R&D, QA, and QC.

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It delivers exceptional precision imaging with traceable, repeatable results and an intuitive workflow that reduces setup effort and operator variability. Using WLI, the OLS5500 provides up to 40× faster throughput than conventional LSM. It is also the world’s first 3D optical profilometer to guarantee accuracy and repeatability for both LSM and WLI measurements—supporting confident decisions when results are reviewed, shared, or challenged.