Computed Tomography for 3D Metrology and Analysis

This year's exhibition focus was on the Phoenix V Tome x M micro-CT system. The system features, among other things, the company's proprietary Scatter Correct scatter beam reduction tool and enables precise 3D metrology and analysis.

In addition to the V Tome x M, Waygate presented X-ray and CT inspection solutions for the electronics and battery industry, including a system for inline inspection with micro-CT, which was presented to trade fair guests on site for the first time using modern augmented reality/mixed reality technology (AR/MR).