Illumination from four directions makes it possible to detect spatial structures on metal, plastic, glass and ceramics with a resolution of 300, 600 or 1,200 dpi. With a speed of up to 1.89 m/s and a scan width of up to 4 m, it ensures fast and reliable defect detection.
When using sensors, regular calibration is of central importance.
Product Manager Stephan Zepf on the advantages of Baumer LowHarmonics technology
Metaphase Lighting Technologies introduces the UB-LL, a passively cooled LED line light. Delivering up to 2.5 million lux, it offers uniform illumination for demanding machine vision applications.
The new MVTec Deep Learning Tool 25.04 simplifies access to AI-based machine vision and accelerates automation workflows.
Alecs combines computational power and easy integration with design flexibility.
