Bachelor thesis on sensor technologies for computed tomography receives award
In February, the Dr.-Ing. Siegfried Werth Foundation awarded a prize to a scientific paper in the field of non-contact dimensional metrology at a ceremony held on the premises of Werth Messtechnik in Giessen.
Der Preisträger Patrick Steidl, der Betreuer von der Technischen Hochschule Mittelhessen Professor Dr. Markus Degünther und die Kuratoriumsmitglieder der Dr.-Ing.-Sigfried-Werth-Stiftung Detlef Ferger und Dr. Ralf Christoph (v.l.). Links oben ist ein Koordinatenmessgerät mit Röntgencomputertomografie zu sehen (Bild: Werth Messtechnik) /
The award winner Patrick Steidl, the supervisor from the Technical University of Central Hesse Professor Dr. Markus Degünther and the members of the Board of Trustees of the Dr.-Ing.-Sigfried-Werth-Stiftung Detlef Ferger and Dr. Ralf Christoph (from left). At the top left is a coordinate measuring machine with X-ray computer tomography
The prize winner is Patrick Steidl for his Bachelor's thesis at the Technical University of Central Hesse, which deals with the development of new sensor technologies for X-ray computer tomography. As the Werth Technology Days, during which the awards are normally presented, had to be cancelled this spring due to the pandemic, the awards ceremony was held in a small circle.
Further prizes were awarded in November 2020 at digital events to scientists from Friedrich Schiller University Jena, the Fraunhofer Institute for Applied Optics and Precision Engineering IOF in Jena and the Technical University of Deggendorf.
