Cognex has introduced its next-generation wafer identification (ID) reader and accompanying software, the In-Sight 1740 series and In-Sight Explorer Wafer ID software version 4.5.0. The new product family includes features designed to improve both read rates and reliability, while making it easier to configure and maintain the reader on a wide range of wafer handling and process tools. Combined, these features help ensure maximum tool uptime, uninterrupted by the need for human intervention in the wafer ID step.

40% faster reading

With more processing power, In-Sight 1740 series wafer readers reduce the typical reading time by 40%. The faster processing speed also helps In-Sight 1740 series readers to take advantage of new automatic, self-optimization features. These new features can dramatically increase read rates and reliability on even the most difficult-to-read ID marks while ensuring trouble-free, unattended operation. In-Sight 1740 series readers also include a superior, integrated illumination system. Cognex In-Sight 1720 series readers were well-regarded for their internal illumination system that produced high-readability bright field images. The In-Sight 1740 series makes this best-in-class illumination system even better due to a built-in row of external LEDs that delivers exceptionally high contrast images of the ID marks on many types of wafers. Plus, as new types of wafer process coatings are developed, the In-Sight 1740 series readers can be extended to meet new imaging challenges with specialized lighting powered by the external light expansion port.