28.07.2022 • Product

Advanced Anomaly Detection Using AI

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The release includes useful additions and enhancements to Halcon's core technologies. The Global Context Anomaly Detection feature can now "understand" the logical content of the entire image and detects new variants of anomalies such as missing, deformed or incorrectly arranged components. This enables the inspection of printed circuit boards in semiconductor manufacturing or the verification of imprints.

The addition of Halcon's Deep OCR lets users perform customised training on their own application data set. This makes it possible to solve even the most complex applications such as reading text with poor contrast (on tyres, for example). Furthermore, Halcon supports various standards for evaluating the print quality of 1D and 2D codes. Additional operators improve image contrast and image smoothing.

Company

MVTec Software GmbH

Arnulfstraße 205
80634 München
Germany

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