Patented device measures the optoelectronic properties of semiconductor materials over a broad spectral range.

Very efficient device combines multimode interference waveguides with machine learning analysis.

Modern microscopy and spectroscopy methods for as many users as possible.

New laser produces the strongest ultra-short laser pulses to date for precision measurements or materials processing.

New device offers over a two-fold improvement in resolution compared to standard approaches.

New end-to-end software solution Wiley Surface-to-Spectral Analysis released.

EU funding of 3.4 million euros for the Pics4sens project

New device enables the measurement of the elasticity of sub-cellular structures.