Vision

Advanced Anomaly Detection Using AI

MVTec

28.07.2022 – Halcon 22.05 is a further development of the deep-learning technology anomaly detection and thus optimises quality assurance

The release includes useful additions and enhancements to Halcon's core technologies. The Global Context Anomaly Detection feature can now "understand" the logical content of the entire image and detects new variants of anomalies such as missing, deformed or incorrectly arranged components. This enables the inspection of printed circuit boards in semiconductor manufacturing or the verification of imprints.

The addition of Halcon's Deep OCR lets users perform customised training on their own application data set. This makes it possible to solve even the most complex applications such as reading text with poor contrast (on tyres, for example). Furthermore, Halcon supports various standards for evaluating the print quality of 1D and 2D codes. Additional operators improve image contrast and image smoothing.

Contact

MVTec Software GmbH

Arnulfstraße 205
80634 München
Germany

+49 89 457 695 0
+49 89 457 695 55

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Top Feature

Digital tools or software can ease your life as a photonics professional by either helping you with your system design or during the manufacturing process or when purchasing components. Check out our compilation:

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