INSPECT 10-2009
CONTENTS
COVERSTORY
Software Development Breaking New Ground
Configuration Replaces Programming
Raoul Kimmelmann
EDITORIAL
Climbing Up
Stephanie Nickl
TOPICS
Treasure Hunt in Stuttgart
INSPECT Discovery Tour at Vision 2009
Reader's Corner
Conquering the Tower of Babel
News
Poll
Event Calender
Online
Topics with Impact: All You Ever Wanted to Know about 3D
3D Vision and 3D Metrology in the INSPECT Panel Discussion
Looking Ahead
New Machine Vision Solutions and Trends at Automatica 2010
Relaxed Technical
Kappa Summer Symposium in Northeim
Bright Prospects
Vision 2009 Ties in with Previous Successes
Preview Trade Show Vision Special
Viewpoint
From Academic to Businessman
Dr. Savvas Chamberlain
Controllable Time
Image Processing Basics: Real-time
Prof. Dr. Christoph Heckenkamp
Visionaries
Interview with Dr. Savvas Chamberlain, Chairman of the Board, Dalsa Corporation
VISION
Package Deal
More than Just Cameras - the Complete Solution for GigE Vision
Carsten Wehe
Smart, Smooth, Strong
Next Generation Smart Camera for Factory Automation
Steve Geraghty
Making Science Fiction Fact
Futuristic Computer Interaction through Stereoscopic Vision
Arnaud Destruels
Take on Color
1-Chip CCD Cameras Compute Colors from Luminance Values
Dr. Henning Bässmann
Speed Booster
Networking Technology Doubles the Speed of GigE Interfaces
Laurette Perrard
Vision System Modeling
Vision System Design Using CAD Software
Matthias Voigt
Award-winning Concept
Smart Camera Purely FPGA Based
The Definition of a Megapixel Lens...
Andreas Kronwald
A Tremendous Potential...
Flexible Topology in GigE-Vision Systems Opens up New Possibilities
Andreas Schaarschmidt
AUTOMATION
Modular, Efficient, Versatile
Platform Strategy for Automated Material Handling
Dr.-Ing. Frank Grünewald
Salt of the Earth
All New Special Platform for System integrators at Vision Trade Show
The Needle in the Haystack
The Quest for Tiny Flaws on Large Surfaces
Dr. Erhardt Barth, Sascha Klement, Fabian Timm
Optimal Combination
Sensor Solutions for the Photovoltaic Production
Thomas Hall
CONTROL
Small, Smaller, Pico
Industrial Metrology Makes Use of Pico Projectors as Optical 3D Sensors
Robert W. Kuhn
Light Messages
Electroluminescence Analysis Rises Quality of Thin-film Solar Cells
Raf Vandersmissen