INSPECT 10-2009

CONTENTS

COVERSTORY
Software Development Breaking New Ground
Configuration Replaces Programming
Raoul Kimmelmann

EDITORIAL
Climbing Up
Stephanie Nickl

TOPICS
Treasure Hunt in Stuttgart
INSPECT Discovery Tour at Vision 2009

Reader's Corner
Conquering the Tower of Babel

News
Poll
Event Calender
Online

Topics with Impact: All You Ever Wanted to Know about 3D
3D Vision and 3D Metrology in the INSPECT Panel Discussion

Looking Ahead
New Machine Vision Solutions and Trends at Automatica 2010

Relaxed Technical
Kappa Summer Symposium in Northeim

Bright Prospects
Vision 2009 Ties in with Previous Successes

Preview Trade Show Vision Special

Viewpoint
From Academic to Businessman
Dr. Savvas Chamberlain

Controllable Time
Image Processing Basics: Real-time
Prof. Dr. Christoph Heckenkamp

Visionaries
Interview with Dr. Savvas Chamberlain, Chairman of the Board, Dalsa Corporation

VISION
Package Deal
More than Just Cameras - the Complete Solution for GigE Vision
Carsten Wehe

Smart, Smooth, Strong
Next Generation Smart Camera for Factory Automation
Steve Geraghty

Making Science Fiction Fact
Futuristic Computer Interaction through Stereoscopic Vision
Arnaud Destruels

Take on Color
1-Chip CCD Cameras Compute Colors from Luminance Values
Dr. Henning Bässmann

Speed Booster
Networking Technology Doubles the Speed of GigE Interfaces
Laurette Perrard

Vision System Modeling
Vision System Design Using CAD Software
Matthias Voigt

Award-winning Concept
Smart Camera Purely FPGA Based

The Definition of a Megapixel Lens...
Andreas Kronwald

A Tremendous Potential...
Flexible Topology in GigE-Vision Systems Opens up New Possibilities
Andreas Schaarschmidt

AUTOMATION
Modular, Efficient, Versatile
Platform Strategy for Automated Material Handling
Dr.-Ing. Frank Grünewald

Salt of the Earth
All New Special Platform for System integrators at Vision Trade Show

The Needle in the Haystack
The Quest for Tiny Flaws on Large Surfaces
Dr. Erhardt Barth, Sascha Klement, Fabian Timm

Optimal Combination
Sensor Solutions for the Photovoltaic Production
Thomas Hall

CONTROL
Small, Smaller, Pico
Industrial Metrology Makes Use of Pico Projectors as Optical 3D Sensors
Robert W. Kuhn

Light Messages
Electroluminescence Analysis Rises Quality of Thin-film Solar Cells
Raf Vandersmissen

 

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