Automation

Inspection of Thin-Film Solar Modules

Basler’s in-line metrology solutions secure premier quality of Sunfilm solar modules

Sunfilm has integrated three in-line Metrology solutions from Basler Vision Technologies into their Thin-Film Line for photovoltaic modules. This 100% quality inspection before and after relevant processing stages goes beyond the approach of other PV module manufacturers and secures Sunfilm a decisive competitive edge.

All three Basler Sensic inspection systems are in-line-systems. They were installed and put into operation with minimal downtime, since Sunfilm's SunFab line was operating in series production throughout the complete integration process. The data exchange between the SunFab's Factory Automation system and Basler's metrology system is realized via the standard industry protocol SECS/GEM, which allows an online and in-time data exchange.

Sunfilm is the first Applied Materials customer using tandem junction thin-film silicon cell structure. This technology allows a larger part of the solar spectrum to be harvested as compared to amorphous silicon thin-film solar modules, leading to higher module efficiencies.


Basler's Sensic Thin-Film Inspection Solutions are:

Glass Inspection:
Glass inspection solutions from Basler are available for the inspection of incoming goods (TCO coated or uncoated) and monitor cleaning operations carried out in the course of production. The inspection solution is designed as a reliable means of detecting and classifying surface defects and impurities, with a special focus on secure detection of edge defects that could result in glass breakage and result in considerable downtime.

CVD Coating Inspection:
The CVD Coating Inspection is designed for quality control of semi-conductor coatings on thin-film modules, able to provide not only the number, but also the distribution of pinholes in the coating. Pinholes inside the photoactive layer impair the efficiency of solar cells by short-circuiting. Malfunctions or contamination during the coating process are detected as early as possible.

Final Inspection:
Another inspection solution in Basler's Sensic Thin-Film Inspection family is the Final Inspection, designed for the inspection after the lamination process. The solution encompasses tests on the peripheral and photoactive areas for bubbles, scratches and delamination. Those can result in the penetration of moisture, which can have a direct detrimental influence on the quality and service life of modules.

Contact

Basler AG

An der Strusbek 60-62
22926 Ahrensburg
Germany

+49 4102 463 500
+49 4102 463 109

Digital tools or software can ease your life as a photonics professional by either helping you with your system design or during the manufacturing process or when purchasing components. Check out our compilation:

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Digital tools or software can ease your life as a photonics professional by either helping you with your system design or during the manufacturing process or when purchasing components. Check out our compilation:

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