INSPECT 03-2010
COVERSTORY
Battling Windmills?
High-performance Platform for Computation-intensive Machine Vision Applications
Raoul Kimmelmann
EDITORIAL
Vision(s) of the Future
Gabriele Jansen
TOPICS
Looking Machines
Automatica from June, 8 until June, 11, 2010, in Munich, Germany
Big in Japan
ISS 2010: Image Sensing Show in Yokohama, Japan
10th Optatec in Frankfurt, Germany
International Trade Fair for Optical Technologies Components and Systems
Event Calendar
News
Online
Poll
"I Have a Dream"
Automation Technology Opens up Bin Picking Solutions
Holger Hofmann
Reader's Corner
Market Report on 3D-Metrology for German Automotive and Supplier Industries
EMVA 2010: European Machine Vision Adventure
International Machine Vision on a Journey across Europe
Contour Tracking
Image Processing Basics: Contour-based Pattern Matching
Prof. Dr. Christoph Heckenkamp
Visionaries
Interview with Dr. Norbert Stein, Managing Director and Sole Shareholder of Vitronic
VISION
Million-seller on the Advance into Machine Vision
USB 3.0: Promising in Market Penetration and Convincing in Technical Merits
Michael Gibbons
Baptism by Fire for Vision System
Vision System Automates Fire Extinguisher Container Production
Claude Kuhnen
Avatar Out of Bavaria?
3D Tools and Movie2 Are Two of the New CVB 10.2 Features
Powerful Combination
Line Scan Cameras with CMOS Sensors: Reduced System Noise and High Read-out Rates
Tim Miller
AUTOMATION
Tight Integration of Robotics and Vision
Market Changes Require Flexible Manufacturing
Ignazio Piacentini
Exact Seams
Contour Curve Detection for Robot Path Correction
Dr. Werner Neddermeyer, Ralf König
Safety on the Roads
Tyre Tread Depth Measurement in Moving Traffic
Dr. Michael Bach
Clearing the Box Smartly
Bin Picking: The Masterpiece of Robot Automation
Alexander Hollinger
The Sun's Power
Product Overview: Equipment for Photovoltaic's Production
CONTROL
Towards the Sun
Active Thermography Improves Quality of Solar Cells
Tobias Kröger
Elevated Temperature
Automated Infrared Thermography for Industrial Processes
Not visible?
Product Overview: Thermography and Infrared