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The new Lext OLS5500 hybrid 3D optical profilometer unites Laser Scanning Microscopy (LSM), White Light Interferometry (WLI), and Focus Variation Microscopy (FVM) in one easy-to-use platform.
Digital microscope with AI assistance
The latest eBook (free PDF download) in the Advanced Optical Metrology series is about advances in battery research
Advanced Optical Metrology, with the support of Evident, has now presented an e-book on the subject of geoarchaeology.
This time it's about the development of lithium-ion batteries and their impact on the renewable energy boom.
Evident has launched a new e-book in collaboration with us: This time the topic is characterization techniques for materials in volume
Download the e-book "Optimizing Interface Conductivity in Electronics: LSM Characterization of Surface Properties" now for free.
Automated Material Analysis Using Neural Networks
New facility supports customers and employees in the APAC region with leading-edge technology.
