Cognex has introduced its wafer identification (ID) reader and accompanying software, the In-Sight 1740 series and In-Sight Explorer Wafer ID software version 4.5.0. The new product family includes features designed to improve both read rates and reliability, while making it easier to configure and maintain the reader on a wide range of wafer handling and process tools. Combined, these features help ensure maximum tool uptime, uninterrupted by the need for human intervention in the wafer ID step.

More Power

With more processing power, In-Sight 1740 series wafer readers reduce the typical reading time by 40%. The faster processing speed also helps In-Sight 1740 series readers to take advantage of new automatic, self-optimization features. These new features can dramatically increase read rates and reliability on even the most difficult-to-read ID marks while ensuring trouble-free, unattended operation. The readers also include a integrated illumination system.