A detailed view into the world of surface structures offers Fries Research & Technology (FRT) to its visitors at this year’s Hannover Messe. FRT presents to its customers how their products can be characterized with regard to 3D topography, 2D contour or film-thickness in the micro and nanometer range. The exhibition booth is located within the MicroTechnology part of the Hannover Messe and can be found in Hall 6, booth E16/F3. The measurements at the FRT booth will be performed with the MicroProf 200 – an optical profilometer – and the confocal microscope MicroSpy Topo. The Topo is the entry level metrology tool from FRT which has been awarded with the German Industry Award in 2008. The tool determines rough, reflective and transparent surfaces with the highest possible resolution in 3D.