Thin Film Metrology: Free Ebook is Out Now
Second part of the series "Advanced Optical Metrology"
Thin film technology is ubiquitous across materials science for applications such as semiconductors, electronics, memory devices, energy storage, photovoltaics, chemical sensors, and many more. Furthermore, there are sufficient fabrication techniques that virtually any type of material can be prepared as a thin film.
The 43-page eBook Thin Film Metrology, an overview on the use of laser scanning confocal microscopy in materials science is followed by three recent articles on the fabrication, characterization and applications of thin films.
Contents
3 Thin Film Metrology
9 The Use of Laser Scanning Confocal Microscopy (LSCM) in Materials Science
D.B. Hovis and A.H. Heuer
15 A Novel Slicing Method for Thin Supercapacitors
Hao Sun, Xuemei Fu, Songlin Xie et al.
22 Boosted UV Photodetection Performance in Chemically Etched Amorphous Gallium(III) Oxide Thin-Film Transistors
Zuyin Han, Huili Liang, Wenxing Huo et al.
29 Multiscale and Uniform Liquid Metal Thin-Film Patterning Based on Soft Lithography for 3D Heterogeneous Integrated Soft Microsystems: Additive Stamping and Subtractive Reverse Stamping
Min-gu Kim, Choongsoon Kim, Hommood Alrowais et al.
39 Scientific Publishing: 5 tips for writing better science papers
Contact
Wiley-VCH Verlag